Probe Station

About

Buy a probe station | SMU connectors & cables | Parts & accessories | Key components | Applications | Resources & support Reject the inflated costs of overengineered systems with a probe station that delivers exactly what you need for high-performance, micron-scale probing at a fair price. When set up as the electrical characterization system, you have everything you need to reliably probe, test, and characterize the electrical properties of semiconductor wafers and small-scale electronics. Ossila probe stations are built to accommodate customization so you can configure a setup that works specifically for you, with Ossila micromanipulators and a suite of electrical characterization tools. The practical and intelligent design of each component means you can prioritize your research instead of being limited by unnecessary complexity. Set up a probe station [[collection handle="probe-station" tags="complete probe station"]] Connectors and cables [[collection handle="probe-station" tags="electrical characterization components"]] Probing parts and accessories [[collection handle="probe-station" tags="probe station components"]] Key components of a probe station To create the specialized system that helps to conduct precise electrical measurements on small devices or sensitive materials, Ossila probe stations combine essential and useful components. Built into one system, they work with measurement instruments to analyze electrical parameters, enabling highly accurate testing. Probe station components: micromanipulators, probes, optical microscope, and a stage-mounted wafer chuck. Micromanipulators Ossila manual micromanipulators are used to precisely position probe needles on tiny contact points of a sample, with micron-level accuracy. The direct, hands-on control is intuitive, straightforward, and low cost. With excellent tactile feedback and minimal backlash or drift, you can make intuitive probe adjustments down to2 μm along three axes. The magnetic base